IEEE 1149 family of standards
E53490
The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
All labels observed (6)
| Label | Occurrences |
|---|---|
| IEEE 1149.1 | 10 |
| IEEE 1149 boundary-scan standards family | 2 |
| JTAG | 2 |
| IEEE 1149 family of standards canonical | 1 |
| IEEE 1149 family of test standards | 1 |
| IEEE 1149.x | 1 |
How this entity was disambiguated
This entity first appeared as the object of triple T415890 — resolving that mention is where its identity was fixed. The disambiguator weighed these candidate entities and picked the highlighted one (or “None”, minting a new entity). This is how homonymy is resolved: the same surface form can point to different entities.
NED1
Entity disambiguation (via context triple)
gpt-5-mini-2025-08-07
Target entity: IEEE 1149 family of standards Context triple: [IEEE 1149.6, isPartOf, IEEE 1149 family of standards]
-
A.
IEEE 1149.7
IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
-
B.
IEEE 1149.1 JTAG boundary‑scan standard
The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
-
C.
IEEE 1149.6
IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
-
D.
IEEE Std 610.12-2010
IEEE Std 610.12-2010 is an updated IEEE standard that provides a formal glossary of terms and definitions used in software engineering.
-
E.
IEEE 1532
IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
- F. None of above. chosen
- G. Unsure - the case is ambiguous/there is not enough information to decide.
NED2
Entity disambiguation (via description)
gpt-5-mini-2025-08-07
Target entity: IEEE 1149 family of standards Target entity description: The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
-
A.
IEEE 1149.7
IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
-
B.
IEEE 1149.1 JTAG boundary‑scan standard
The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
-
C.
IEEE 1149.6
IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
-
D.
IEEE Std 610.12-2010
IEEE Std 610.12-2010 is an updated IEEE standard that provides a formal glossary of terms and definitions used in software engineering.
-
E.
IEEE 1532
IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
- F. None of above. chosen
Statements (48)
| Predicate | Object |
|---|---|
| instanceOf |
JTAG boundary-scan standard
ⓘ
family of technical standards ⓘ |
| acronym |
JTAG
ⓘ
linked to:
IEEE 1149.1 JTAG boundary‑scan standard
|
| appliesTo |
digital integrated circuits
ⓘ
printed circuit board assemblies ⓘ |
| basedOn | boundary-scan architecture ⓘ |
| communicationStyle | serial scan chain ⓘ |
| coreStandard |
IEEE 1149.1
ⓘ
linked to:
IEEE 1149 family of standards
|
| defines |
methods for accessing on-chip test features
ⓘ
methods for debugging digital systems ⓘ methods for testing digital integrated circuits ⓘ methods for testing printed circuit boards ⓘ |
| developedBy | Institute of Electrical and Electronics Engineers ⓘ |
| domain | electronic design and test ⓘ |
| enables |
remote debugging of embedded systems
ⓘ
test access through a small number of pins ⓘ test of devices without physical probe access ⓘ |
| includes |
IEEE 1149.1
ⓘ
linked to:
IEEE 1149 family of standards
IEEE 1149.10 ⓘ IEEE 1149.10 gigabit test bus standard ⓘ
linked to:
IEEE 1149.10
IEEE 1149.4 ⓘ IEEE 1149.4 mixed-signal test bus standard ⓘ
linked to:
IEEE 1149.4
IEEE 1149.6 ⓘ IEEE 1149.6 AC-coupled interconnect test standard ⓘ
linked to:
IEEE 1149.6
IEEE 1149.7 ⓘ IEEE 1149.7 compact JTAG standard ⓘ
linked to:
IEEE 1149.7
IEEE 1149.8.1 ⓘ
linked to:
IEEE 1149.6
IEEE 1149.8.1 power-down test standard ⓘ |
| originatedFrom | Joint Test Action Group ⓘ |
| primaryApplication |
in-system programming of devices
ⓘ
manufacturing test of digital boards ⓘ on-chip debug access ⓘ |
| relatedTo |
IEEE 1500 embedded core test standard
ⓘ
IEEE 1532 in-system configuration standard ⓘ
linked to:
IEEE 1532
boundary-scan description language ⓘ |
| standardizedBy | IEEE Standards Association ⓘ |
| supports |
board-level interconnect testing
ⓘ
device-level structural testing ⓘ non-intrusive access to device pins ⓘ test automation in production ⓘ |
| typicalSignals |
TCK
ⓘ
TDI ⓘ TDO ⓘ TMS ⓘ |
| usesConcept |
boundary-scan register
ⓘ
linked to:
IEEE 1149.1 JTAG boundary‑scan standard
instruction register ⓘ test access port ⓘ test data registers ⓘ |
How these facts were elicited
The pipeline generated the facts above by prompting gpt-5.1 with this entity's name + description and the instruction below.
Instruction
You are a knowledge base construction expert. Given a subject entity and a description of it, return factual statements that you know for the subject as a JSON list of dictionaries(triples), where keys must be "subject", "predicate" and "object". The number of facts may be very high, between 25 to 50 or more, for very popular subjects. For less popular subjects, the number of facts can be very low, like 5 or 10. # Requirements - If you don't know the subject at all, return an empty list. - If the subject is not a named entity, return an empty list. - Include at least one triple where predicate is "instanceOf". - Do not get too wordy. - Separate several objects into multiple triples with one object.
Input
Subject: IEEE 1149 family of standards Description of subject: The IEEE 1149 family of standards is a set of Joint Test Action Group (JTAG) boundary-scan specifications that define methods for testing, debugging, and accessing digital integrated circuits and boards.
Referenced by (17)
Full triples — surface form annotated when it differs from this entity's canonical label.
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
linked to: IEEE 1149 family of standards
subject linked to:
IEEE Standard for High-Speed Test Access Port and Boundary-Scan Architecture
linked to: IEEE 1149 family of standards
subject linked to:
IEEE Standard for High-Speed Test Access Port and Boundary-Scan Architecture
linked to: IEEE 1149 family of standards