IEEE 1149.1 JTAG boundary‑scan standard

E1466

The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.

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AI-generated illustration of IEEE 1149.1 JTAG boundary‑scan standard

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Prompt

Generate an image of IEEE 1149.1 JTAG boundary‑scan standard (The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.)

All labels observed (19)

How this entity was disambiguated

Statements (54)

Predicate Object
instanceOf IEEE standard ⓘ
boundary-scan standard ⓘ
electronic test standard ⓘ
alsoKnownAs IEEE 1149.1 ⓘ
JTAG ⓘ
JTAG boundary-scan ⓘ
appliesTo digital integrated circuits ⓘ
printed circuit boards ⓘ
architectureType serial scan chain ⓘ
category design for testability ⓘ
defines IDCODE register ⓘ
TAP controller ⓘ
Test Access Port ⓘ
boundary-scan architecture ⓘ
boundary-scan register ⓘ
bypass register ⓘ
instruction register ⓘ
serial test access port interface ⓘ
test data registers ⓘ
definesOptionalSignal TRST ⓘ
definesSignal TCK ⓘ
TDI ⓘ
TDO ⓘ
TMS ⓘ
field digital integrated circuits ⓘ
electronic design automation ⓘ
printed circuit board testing ⓘ
fullName IEEE Standard Test Access Port and Boundary-Scan Architecture ⓘ
hasFeature boundary-scan cells on digital I/O pins ⓘ
chaining of multiple devices in a scan path ⓘ
control of output pins via scan chain ⓘ
non-intrusive observation of pin states ⓘ
introducedConcept boundary-scan cell ⓘ
test access port ⓘ
publishedBy IEEE Standards Association ⓘ
Institute of Electrical and Electronics Engineers ⓘ
purpose board-level interconnect testing ⓘ
debug access to internal logic ⓘ
in-system programming of devices ⓘ
in-system test of integrated circuits ⓘ
relatedStandard IEEE 1149.4 ⓘ
linked to: IEEE 1149.6

IEEE 1149.6 ⓘ
IEEE 1149.7 ⓘ
IEEE 1532 ⓘ
specifies finite state machine for TAP controller ⓘ
status widely adopted in semiconductor industry ⓘ
supports BYPASS instruction ⓘ
EXTEST instruction ⓘ
IDCODE instruction ⓘ
PRELOAD instruction ⓘ
SAMPLE instruction ⓘ
usedFor field diagnostics ⓘ
hardware debug ⓘ
manufacturing test ⓘ

How these facts were elicited

Referenced by (42)

Full triples — surface form annotated when it differs from this entity's canonical label.

IEEE Standards Association → develops → IEEE 1149.1 JTAG boundary‑scan standard ⓘ
IEEE 1149.1 JTAG boundary-scan standard → alsoKnownAs → IEEE 1149.1 ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard → alsoKnownAs → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard → alsoKnownAs → JTAG boundary-scan ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard → fullName → IEEE Standard Test Access Port and Boundary-Scan Architecture ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard → supports → EXTEST instruction ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TRST → usedInStandard → IEEE 1149.1 ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TRST → usedInInterface → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TRST → definedBy → IEEE 1149.1 JTAG specification ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS → usedInStandard → IEEE 1149.1 ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS → usedIn → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS → associatedWith → TAP (Test Access Port) ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS → definedIn → IEEE 1149.1 JTAG specification ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TDI → usedIn → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TDI → usedIn → IEEE 1149.1 boundary-scan ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1532 → extends → IEEE 1149.1 ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1532 → usesInterface → IEEE 1149.1 Test Access Port ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1532 → relatedTo → IEEE 1149.1 ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.6 → extends → IEEE 1149.1 ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.6 → isCompatibleWith → IEEE 1149.1 test access port (TAP) ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.7 → compatibleWith → IEEE 1149.1 test access port ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149 family of standards → acronym → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149 family of standards → usesConcept → boundary-scan register ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.4 → relatedTo → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.4 → compatibleWith → IEEE 1149.1 boundary-scan chains ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.10 → complements → IEEE 1149.1 boundary-scan architecture ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Cyclone → configurationMethod → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
ARC → hasDebugInterface → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1500 embedded core test standard → relatedTo → IEEE 1149.1 boundary-scan standard ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group → abbreviation → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group → developed → JTAG boundary-scan architecture ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group → influenced → IEEE 1149.1 boundary-scan standard ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group → alsoRefersTo → JTAG interface ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group → hasAlternativeName → JTAG boundary-scan group ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.10 → relatedTo → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
ESP-IDF → supportsDebuggingWith → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Keil MDK → supportsDebugInterface → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Cyclone II → configurationInterface → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
STM32 series boards → supportsDebugInterface → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Atmel Studio (legacy) → supportsDebuggerInterface → JTAG ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1687 embedded instrumentation standard → compatibleWith → IEEE 1149.1 boundary-scan architecture ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1687 embedded instrumentation standard → relatedTo → IEEE 1149.1 boundary-scan standard ⓘ
linked to: IEEE 1149.1 JTAG boundary‑scan standard