IEEE 1149.1 JTAG boundary‑scan standard

E1466

The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.

All labels observed (19)

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Statements (54)

Predicate Object
instanceOf IEEE standard
boundary-scan standard
electronic test standard
alsoKnownAs IEEE 1149.1
JTAG
JTAG boundary-scan
appliesTo digital integrated circuits
printed circuit boards
architectureType serial scan chain
category design for testability
defines IDCODE register
TAP controller
Test Access Port
boundary-scan architecture
boundary-scan register
bypass register
instruction register
serial test access port interface
test data registers
definesOptionalSignal TRST
definesSignal TCK
TDI
TDO
TMS
field digital integrated circuits
electronic design automation
printed circuit board testing
fullName IEEE Standard Test Access Port and Boundary-Scan Architecture
hasFeature boundary-scan cells on digital I/O pins
chaining of multiple devices in a scan path
control of output pins via scan chain
non-intrusive observation of pin states
introducedConcept boundary-scan cell
test access port
publishedBy IEEE Standards Association
Institute of Electrical and Electronics Engineers
purpose board-level interconnect testing
debug access to internal logic
in-system programming of devices
in-system test of integrated circuits
relatedStandard IEEE 1149.4
linked to: IEEE 1149.6

IEEE 1149.6
IEEE 1149.7
IEEE 1532
specifies finite state machine for TAP controller
status widely adopted in semiconductor industry
supports BYPASS instruction
EXTEST instruction
IDCODE instruction
PRELOAD instruction
SAMPLE instruction
usedFor field diagnostics
hardware debug
manufacturing test

How these facts were elicited

Referenced by (35)

Full triples — surface form annotated when it differs from this entity's canonical label.

IEEE Standards Association develops IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard alsoKnownAs IEEE 1149.1
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard alsoKnownAs JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard alsoKnownAs JTAG boundary-scan
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard fullName IEEE Standard Test Access Port and Boundary-Scan Architecture
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.1 JTAG boundary-scan standard supports EXTEST instruction
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TRST usedInStandard IEEE 1149.1
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TRST usedInInterface JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TRST definedBy IEEE 1149.1 JTAG specification
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS usedInStandard IEEE 1149.1
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS usedIn JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS associatedWith TAP (Test Access Port)
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TMS definedIn IEEE 1149.1 JTAG specification
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TDI usedIn JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
TDI usedIn IEEE 1149.1 boundary-scan
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1532 extends IEEE 1149.1
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1532 usesInterface IEEE 1149.1 Test Access Port
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1532 relatedTo IEEE 1149.1
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.6 extends IEEE 1149.1
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.6 isCompatibleWith IEEE 1149.1 test access port (TAP)
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.7 compatibleWith IEEE 1149.1 test access port
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149 family of standards acronym JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149 family of standards usesConcept boundary-scan register
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.4 relatedTo JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.4 compatibleWith IEEE 1149.1 boundary-scan chains
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.10 complements IEEE 1149.1 boundary-scan architecture
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Cyclone configurationMethod JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
ARC hasDebugInterface JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1500 embedded core test standard relatedTo IEEE 1149.1 boundary-scan standard
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group abbreviation JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group developed JTAG boundary-scan architecture
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group influenced IEEE 1149.1 boundary-scan standard
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group alsoRefersTo JTAG interface
linked to: IEEE 1149.1 JTAG boundary‑scan standard
Joint Test Action Group hasAlternativeName JTAG boundary-scan group
linked to: IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.10 relatedTo JTAG
linked to: IEEE 1149.1 JTAG boundary‑scan standard