IEEE 1149.7
E10411
IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
All labels observed (5)
| Label | Occurrences |
|---|---|
| IEEE 1149.7 canonical | 4 |
| IEEE 1149.7 compact JTAG standard | 1 |
| IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture | 1 |
| cJTAG | 1 |
| compact JTAG | 1 |
How this entity was disambiguated
This entity first appeared as the object of triple T73265 — resolving that mention is where its identity was fixed. The disambiguator weighed these candidate entities and picked the highlighted one (or “None”, minting a new entity). This is how homonymy is resolved: the same surface form can point to different entities.
NED1
Entity disambiguation (via context triple)
gpt-5-mini-2025-08-07
Target entity: IEEE 1149.7 Context triple: [IEEE 1149.1 JTAG boundary-scan standard, relatedStandard, IEEE 1149.7]
-
A.
IEEE 1149.6
IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
-
B.
IEEE 1149.1 JTAG boundary‑scan standard
The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
-
C.
IEEE 1532
IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
-
D.
ITU-T G.8275.1
ITU-T G.8275.1 is a telecommunications standard that specifies a profile for precise time and phase synchronization over packet networks, particularly for mobile and other time-sensitive services.
-
E.
IEEE 488 GPIB standard
The IEEE 488 GPIB standard is a widely used digital interface specification that enables communication and control among electronic test and measurement instruments and computers.
- F. None of above. chosen
- G. Unsure - the case is ambiguous/there is not enough information to decide.
NED2
Entity disambiguation (via description)
gpt-5-mini-2025-08-07
Target entity: IEEE 1149.7 Target entity description: IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
-
A.
IEEE 1149.6
IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
-
B.
IEEE 1149.1 JTAG boundary‑scan standard
The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
-
C.
IEEE 1532
IEEE 1532 is an extension of the JTAG boundary-scan standard that defines in-system programming and configuration procedures for programmable devices such as FPGAs and CPLDs.
-
D.
ITU-T G.8275.1
ITU-T G.8275.1 is a telecommunications standard that specifies a profile for precise time and phase synchronization over packet networks, particularly for mobile and other time-sensitive services.
-
E.
IEEE 488 GPIB standard
The IEEE 488 GPIB standard is a widely used digital interface specification that enables communication and control among electronic test and measurement instruments and computers.
- F. None of above. chosen
Statements (49)
| Predicate | Object |
|---|---|
| instanceOf |
IEEE standard
ⓘ
JTAG-related standard ⓘ test and debug standard ⓘ |
| alsoKnownAs |
cJTAG
ⓘ
linked to:
IEEE 1149.7
compact JTAG ⓘ
linked to:
IEEE 1149.7
|
| appliesTo |
complex integrated circuits
ⓘ
microcontrollers ⓘ system-on-chip devices ⓘ |
| basedOn |
JTAG
ⓘ
linked to:
IEEE 1149 family of standards
|
| compatibleWith |
IEEE 1149.1 test access port
ⓘ
linked to:
IEEE 1149.1 JTAG boundary‑scan standard
|
| defines |
enhanced boundary-scan architecture
ⓘ
reduced-pin test access port ⓘ |
| domain |
embedded systems
ⓘ
integrated circuit test ⓘ on-chip debug ⓘ |
| extends |
IEEE 1149.1
ⓘ
linked to:
IEEE 1149 family of standards
|
| feature |
backward compatibility with legacy JTAG tools
ⓘ
class-based feature levels ⓘ enhanced device addressing ⓘ low-power operation modes ⓘ reduced pin interface for small packages ⓘ |
| fullName |
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
ⓘ
linked to:
IEEE 1149.7
|
| goal |
add advanced debug capabilities
ⓘ
add trace capabilities ⓘ reduce JTAG pin count ⓘ reduce power consumption during test and debug ⓘ |
| relatedTo |
IEEE 1149.1
ⓘ
linked to:
IEEE 1149 family of standards
IEEE 1149.4 ⓘ IEEE 1149.6 ⓘ on-chip debug architectures ⓘ |
| standardizedBy |
IEEE
ⓘ
IEEE Standards Association ⓘ |
| supports |
2-pin JTAG operation
ⓘ
4-pin JTAG operation ⓘ advanced scan formats ⓘ debug access to multiple cores ⓘ hot connect and disconnect of debug tools ⓘ multi-drop topology ⓘ point-to-point topology ⓘ power management features for debug ⓘ star topology ⓘ trace data transport over JTAG pins ⓘ |
| targetEnvironment |
low-power embedded devices
ⓘ
modern integrated circuits with high pin-count constraints ⓘ |
| usedFor |
board-level test
ⓘ
in-system programming ⓘ manufacturing test ⓘ run-time debug ⓘ trace collection ⓘ |
How these facts were elicited
The pipeline generated the facts above by prompting gpt-5.1 with this entity's name + description and the instruction below.
Instruction
You are a knowledge base construction expert. Given a subject entity and a description of it, return factual statements that you know for the subject as a JSON list of dictionaries(triples), where keys must be "subject", "predicate" and "object". The number of facts may be very high, between 25 to 50 or more, for very popular subjects. For less popular subjects, the number of facts can be very low, like 5 or 10. # Requirements - If you don't know the subject at all, return an empty list. - If the subject is not a named entity, return an empty list. - Include at least one triple where predicate is "instanceOf". - Do not get too wordy. - Separate several objects into multiple triples with one object.
Input
Subject: IEEE 1149.7 Description of subject: IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
Referenced by (8)
Full triples — surface form annotated when it differs from this entity's canonical label.
subject linked to:
IEEE 1149.1 JTAG boundary‑scan standard
IEEE 1149.7
→
fullName
→
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
ⓘ
linked to: IEEE 1149.7
linked to: IEEE 1149.7
linked to: IEEE 1149.7
linked to: IEEE 1149.7