Joint Test Action Group

E265711

The Joint Test Action Group (JTAG) is an industry consortium that developed the boundary-scan test methodology for integrated circuits, which became standardized as the IEEE 1149.x family of standards.

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Joint Test Action Group canonical 1

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Predicate Object
instanceOf industry consortium
standards development group
abbreviation JTAG
alsoRefersTo JTAG boundary-scan
JTAG interface
JTAG port
appliesTo digital integrated circuits
printed circuit board assemblies
system-on-chip devices
contributedToStandard IEEE 1149.1
IEEE 1149.x family of standards
developed JTAG boundary-scan architecture
boundary-scan test methodology
serial scan chain methodology for IC pins
test access port concept
enables non-intrusive access to IC pins
standardized test access port on ICs
test of devices with limited physical access
field design for testability
electronics testing
integrated circuit testing
focusesOn board-level interconnect testing
boundary-scan testing of integrated circuits
debug access mechanisms
in-system programming support
hasAlternativeName JTAG boundary-scan group
hasConcept TCK signal
TDI signal
TDO signal
TMS signal
Test Access Port
boundary-scan register
data register
instruction register
scan chain
influenced IEEE 1149.1 boundary-scan standard
subsequent IEEE 1149.x extensions
primaryStandard IEEE 1149.1
relatedStandard IEEE 1149.1
IEEE 1149.10
IEEE 1149.4
IEEE 1149.6
IEEE 1149.7
IEEE 1149.8.1
linked to: IEEE 1149.6
standardFamilyName IEEE 1149.x
standardizedBy Institute of Electrical and Electronics Engineers
usedFor on-chip debug access
production testing of digital ICs
programming flash memory in-system
testing printed circuit board interconnects

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IEEE 1149 family of standards originatedFrom Joint Test Action Group