Joint Test Action Group

E265711

The Joint Test Action Group (JTAG) is an industry consortium that developed the boundary-scan test methodology for integrated circuits, which became standardized as the IEEE 1149.x family of standards.

All labels observed (1)

Label Occurrences
Joint Test Action Group canonical 1

How this entity was disambiguated

Statements (50)

Predicate Object
instanceOf industry consortium ⓘ
standards development group ⓘ
abbreviation JTAG ⓘ
alsoRefersTo JTAG boundary-scan ⓘ
JTAG interface ⓘ
JTAG port ⓘ
appliesTo digital integrated circuits ⓘ
printed circuit board assemblies ⓘ
system-on-chip devices ⓘ
contributedToStandard IEEE 1149.1 ⓘ
IEEE 1149.x family of standards ⓘ
developed JTAG boundary-scan architecture ⓘ
boundary-scan test methodology ⓘ
serial scan chain methodology for IC pins ⓘ
test access port concept ⓘ
enables non-intrusive access to IC pins ⓘ
standardized test access port on ICs ⓘ
test of devices with limited physical access ⓘ
field design for testability ⓘ
electronics testing ⓘ
integrated circuit testing ⓘ
focusesOn board-level interconnect testing ⓘ
boundary-scan testing of integrated circuits ⓘ
debug access mechanisms ⓘ
in-system programming support ⓘ
hasAlternativeName JTAG boundary-scan group ⓘ
hasConcept TCK signal ⓘ
TDI signal ⓘ
TDO signal ⓘ
TMS signal ⓘ
Test Access Port ⓘ
boundary-scan register ⓘ
data register ⓘ
instruction register ⓘ
scan chain ⓘ
influenced IEEE 1149.1 boundary-scan standard ⓘ
subsequent IEEE 1149.x extensions ⓘ
primaryStandard IEEE 1149.1 ⓘ
relatedStandard IEEE 1149.1 ⓘ
IEEE 1149.10 ⓘ
IEEE 1149.4 ⓘ
IEEE 1149.6 ⓘ
IEEE 1149.7 ⓘ
IEEE 1149.8.1 ⓘ
linked to: IEEE 1149.6
standardFamilyName IEEE 1149.x ⓘ
standardizedBy Institute of Electrical and Electronics Engineers ⓘ
usedFor on-chip debug access ⓘ
production testing of digital ICs ⓘ
programming flash memory in-system ⓘ
testing printed circuit board interconnects ⓘ

How these facts were elicited

Referenced by (1)

Full triples — surface form annotated when it differs from this entity's canonical label.

IEEE 1149 family of standards → originatedFrom → Joint Test Action Group ⓘ