Test Access Port

E912830

A Test Access Port (TAP) is the standardized hardware interface defined by the JTAG boundary-scan architecture that provides external access for testing, debugging, and programming integrated circuits and boards.

All labels observed (1)

Label Occurrences
Test Access Port canonical 2

How this entity was disambiguated

Statements (48)

Predicate Object
instanceOf JTAG interface ⓘ
hardware interface ⓘ
test access mechanism ⓘ
abbreviation TAP ⓘ
allows chained connection of multiple devices ⓘ
external access to internal test logic ⓘ
non-intrusive board-level testing ⓘ
connectsTo JTAG test equipment ⓘ
boundary-scan chain ⓘ
controls TAP controller ⓘ
definedBy IEEE 1149.1 ⓘ
enablesAccessTo boundary-scan register ⓘ
data registers ⓘ
instruction register ⓘ
hasComponent TCK pin ⓘ
TDI pin ⓘ
TDO pin ⓘ
TMS pin ⓘ
hasFullName Test Access Port ⓘ
hasOptionalComponent TRST pin ⓘ
hasSignalType synchronous serial ⓘ
interpretsControlSignal TMS ⓘ
isAccessedBy JTAG controller ⓘ
boundary-scan tester ⓘ
on-chip debug tools ⓘ
isRelatedTo boundary-scan testing ⓘ
design-for-testability ⓘ
isStandardizedIn IEEE 1149.1 boundary-scan standard ⓘ
isUsedIn ASICs ⓘ
linked to: ASIC

FPGAs ⓘ
linked to: FPGA

digital integrated circuits ⓘ
microcontrollers ⓘ
system-on-chip devices ⓘ
mayIncludeResetSignal TRST ⓘ
operatesWithClock TCK ⓘ
outputsDataOn TDO ⓘ
partOf JTAG boundary-scan architecture ⓘ
receivesDataOn TDI ⓘ
supportsOperation boundary-scan test ⓘ
device identification via IDCODE ⓘ
in-circuit debugging ⓘ
in-system programming ⓘ
usedFor debugging integrated circuits ⓘ
debugging printed circuit boards ⓘ
programming devices on a board ⓘ
programming integrated circuits ⓘ
testing integrated circuits ⓘ
testing printed circuit boards ⓘ

How these facts were elicited

Referenced by (2)

Full triples — surface form annotated when it differs from this entity's canonical label.

Joint Test Action Group → hasConcept → Test Access Port ⓘ
Test Access Port → hasFullName → Test Access Port ⓘ