TDI

E6442

TDI (Test Data In) is the serial input pin used in JTAG boundary-scan to feed test instructions and data into a device’s test access port.

AI illustration

How this image was made

AI-generated illustration of TDI

This AI-generated illustration was produced by black-forest-labs/FLUX.2-dev (1024x1024) from a prompt written by openai/gpt-oss-120b from the entity's label + description.

Prompt

Generate an image of TDI (TDI (Test Data In) is the serial input pin used in JTAG boundary-scan to feed test instructions and data into a device’s test access port.)

All labels observed (1)

Label Occurrences
TDI canonical 2

How this entity was disambiguated

Statements (33)

Predicate Object
instanceOf JTAG signal ⓘ
test access port pin ⓘ
abbreviationOf Test Data In ⓘ
chainPosition first JTAG input of a device in a scan chain ⓘ
clockedBy TCK ⓘ
connectedTo TDO of previous device in JTAG chain ⓘ
dataDirection input ⓘ
dataPath feeds serial scan path inside device ⓘ
definedIn IEEE 1149.1 standard ⓘ
directionRelativeToDevice from external JTAG controller into device ⓘ
electricalType digital input pin ⓘ
fullName Test Data In ⓘ
function serial input of test data ⓘ
serial input of test instructions ⓘ
logicalLevel binary ⓘ
partOf JTAG test access port interface ⓘ
relatedSignal TCK ⓘ
TDO ⓘ
TMS ⓘ
TRST ⓘ
requires proper termination in multi-device chains ⓘ
requiresComplianceWith JTAG timing specifications ⓘ
roleInTAP input pin to the test access port ⓘ
sampledOn TCK rising edge ⓘ
signalType serial ⓘ
usedDuring boundary-scan testing ⓘ
debug operations via JTAG ⓘ
in-system programming ⓘ
usedFor shifting data into data registers ⓘ
shifting data into instruction register ⓘ
usedIn IEEE 1149.1 boundary-scan ⓘ
JTAG ⓘ
voltageDomain device I/O supply domain ⓘ

How these facts were elicited

Referenced by (2)

Full triples — surface form annotated when it differs from this entity's canonical label.

IEEE 1149.1 JTAG boundary-scan standard → definesSignal → TDI ⓘ
TMS → worksWith → TDI ⓘ