Triple

T22096680
Position Surface form Disambiguated ID Type / Status
Subject Joshua Tree Art Gallery E546052 entity
Predicate abbreviation P43 FINISHED
Object JTAG
JTAG is an art gallery located in Joshua Tree, California, showcasing contemporary works by local and regional artists.
E1517928 NE FINISHED

How this triple was built (4 steps)

Every LLM step that produced this triple, in pipeline order — named-entity classification, the disambiguation choices (the exact options shown, with the pick highlighted), and the generated description. The batch + timestamp of each is in the Provenance table below.

NER Named-entity recognition gpt-5-mini
Instruction
Given a phrase, classify it is english named entity (e.g., persons, organizations, works of art) in Latin script, or not (e.g., literals, dates, URLs, verbose phrases). For disambiguation, the statement where the phrase occurs as object is also given. Please return a JSON object with `phrase` (string, the phrase being analyzed) and `is_ne` (boolean, indicating whether the phrase is a Named Entity).
Input
Phrase: JTAG | Statement: [Joshua Tree Art Gallery, abbreviation, JTAG]
NED1 Entity disambiguation (via context triple) gpt-5-mini-2025-08-07
Target entity: JTAG
Context triple: [Joshua Tree Art Gallery, abbreviation, JTAG]
  • A. IEEE 1149.1 JTAG boundary‑scan standard
    The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
  • B. J-Link
    J-Link is a widely used family of JTAG/SWD debug probes from SEGGER that provides fast, reliable programming and debugging for a broad range of microcontrollers.
  • C. IEEE 1149.6
    IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
  • D. IEEE 1149.4
    IEEE 1149.4 is a mixed-signal test bus standard that extends JTAG boundary-scan techniques to support testing and diagnosis of analog and mixed-signal circuits on printed circuit boards.
  • E. IEEE 1149.7
    IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
  • F. None of above. chosen
  • G. Unsure - the case is ambiguous/there is not enough information to decide.
NEDg Description generation gpt-5.1
Instruction
Generate a one-sentence description of the target entity. 
You are given a context triple in the form (subject, predicate, object), where the object is the target entity. 
# Instructions
Use the triple to infer relevant information about the entity. Describe the entity based on what is most defining, well-known. 
Avoid repeating the information from the triple, unless really essential.
# Response Format
Return only the sentence: "Description: [one-sentence description of the target entity]"
Input
Entity: JTAG
Triple: [Joshua Tree Art Gallery, abbreviation, JTAG]
Generated description
JTAG is an art gallery located in Joshua Tree, California, showcasing contemporary works by local and regional artists.
NED2 Entity disambiguation (via description) gpt-5-mini-2025-08-07
Target entity: JTAG
Target entity description: JTAG is an art gallery located in Joshua Tree, California, showcasing contemporary works by local and regional artists.
  • A. IEEE 1149.1 JTAG boundary‑scan standard
    The IEEE 1149.1 JTAG boundary-scan standard is a widely used test and debug specification that defines a serial interface and architecture for accessing and testing the internal logic and interconnects of integrated circuits and circuit boards.
  • B. J-Link
    J-Link is a widely used family of JTAG/SWD debug probes from SEGGER that provides fast, reliable programming and debugging for a broad range of microcontrollers.
  • C. IEEE 1149.6
    IEEE 1149.6 is a boundary-scan test standard that extends JTAG to support structural testing of high-speed AC-coupled and differential digital interconnects on printed circuit boards.
  • D. IEEE 1149.4
    IEEE 1149.4 is a mixed-signal test bus standard that extends JTAG boundary-scan techniques to support testing and diagnosis of analog and mixed-signal circuits on printed circuit boards.
  • E. IEEE 1149.7
    IEEE 1149.7 is a compact, enhanced version of the JTAG test and debug standard that reduces pin count and power while adding advanced debug and trace capabilities for modern integrated circuits.
  • F. None of above. chosen

Provenance (5 batches)

The batch behind each pipeline step, in order, with when it ran. Timestamps are batch-level — stages were processed in waves, so the object chain (NER → NED1 → NEDg → NED2) reads in order, but predicate / elicitation batches can sit in a different wave.

Step Stage Batch ID Status When
creating Elicitation batch_69e11e36d03c8190a83a1ba802b7231b completed April 16, 2026, 5:36 p.m.
NER Named-entity recognition batch_69f128e8f1f48190a5f1d9e96a6de688 completed April 28, 2026, 9:38 p.m.
NED1 Entity disambiguation (via context triple) batch_6a0a87a17044819085fcd9c08b06677f completed May 18, 2026, 3:29 a.m.
NEDg Description generation batch_6a0a88655b088190870c4ff9b6960c08 completed May 18, 2026, 3:32 a.m.
NED2 Entity disambiguation (via description) batch_6a0a893b67f081909967ba88ce7922a0 completed May 18, 2026, 3:36 a.m.
Created at: April 16, 2026, 8:30 p.m.