X-ray microscopy

E627333

X-ray microscopy is an imaging technique that uses X-rays instead of visible light to produce high-resolution images of the internal structure of materials and biological specimens at the nanoscale.

All labels observed (1)

Label Occurrences
X-ray microscopy canonical 1

How this entity was disambiguated

Statements (58)

Predicate Object
instanceOf imaging technique ⓘ
microscopy technique ⓘ
advantageOver optical microscopy at high thickness ⓘ
canImage dense materials ⓘ
thick biological samples ⓘ
canProvide 3D reconstructions via tomography ⓘ
comparedTo electron microscopy ⓘ
contrastsWith optical microscopy ⓘ
enables in situ experiments ⓘ
nanoscale tomography ⓘ
operando studies ⓘ
hasApplication battery research ⓘ
biology ⓘ
catalysis research ⓘ
cell biology ⓘ
geoscience ⓘ
materials science ⓘ
nanotechnology ⓘ
pharmaceutical research ⓘ
semiconductor inspection ⓘ
structural biology ⓘ
hasCapability high-resolution imaging ⓘ
hasFeature 3D imaging capability ⓘ
chemical sensitivity ⓘ
element-specific contrast ⓘ
large penetration depth ⓘ
nanoscale spatial resolution ⓘ
non-destructive imaging ⓘ
short wavelength illumination ⓘ
hasType X-ray fluorescence microscopy ⓘ
X-ray holographic microscopy ⓘ
X-ray phase-contrast microscopy ⓘ
coherent diffractive imaging ⓘ
full-field X-ray microscopy ⓘ
ptychography ⓘ
scanning X-ray microscopy ⓘ
transmission X-ray microscopy ⓘ
isLimitedBy availability of bright X-ray sources ⓘ
radiation damage to samples ⓘ
isUsedAt X-ray free-electron laser facilities ⓘ
synchrotron facilities ⓘ
offersResolution nanometer scale ⓘ
operatesIn hard X-ray regime ⓘ
soft X-ray regime ⓘ
replaces visible light ⓘ
requires X-ray detector ⓘ
X-ray optics ⓘ
X-ray source ⓘ
studies biological specimens ⓘ
internal structure of materials ⓘ
uses X-rays ⓘ
usesOptics Fresnel zone plates ⓘ
Kirkpatrick–Baez mirrors ⓘ
capillary optics ⓘ
zone plates ⓘ
usesSource X-ray free-electron laser ⓘ
laboratory X-ray tube ⓘ
synchrotron radiation ⓘ

How these facts were elicited

Referenced by (1)

Full triples — surface form annotated when it differs from this entity's canonical label.

Albert Baez → knownFor → X-ray microscopy ⓘ